BRUKER Q4 POLO OES Arc Spark Spectrometer - Little Space, Mighty Performance

• Outstanding precision, particularly on light elements. 
• Excellent performance in Aluminium analysis.
• Excellent results in the challenging analysis of cast iron.
• Reliable analysis of nitrogen at low ppm levels in low alloyed steels.
• Analysis of oxygen in copper.

For Ferrous and Non Ferrous Applications:

• Iron Base
• Copper Base
• Aluminium Base
• Nickel Base
• Tin / Lead Base

Category by Spectrometer

Portable XRF (PXRF) analyzers monitor elemental nutrients and heavy metals in the pursuit of healthy soils and plants. Regenerative agriculture is a critical component of our planet’s environmental sustainability; and, it requires practical expertise in soil science, crop science, and botany. This video highlights the applications of scientists in those disciplines who use PXRF to help optimize the growing cycle of plant systems for both small-holder and large farms. Their analyses of seeds, soils, roots, fertilizers, leaves and fruit in a variety of climate situations are illustrated. X-ray fluorescence (XRF) technology is explained. The CTX portable benchtop XRF and the S1 TITAN and TRACER 5 handheld XRF elemental analyzer solutions from Bruker are also described.

• Bruker S1 Titan 800
• Bruker Tracer 5
• Bruker CTX

Category by Handheld XRF

Bruker Handheld XRF Safety Training Video

• Radiation Units
• Shielding & Safety shield for small samples
• Radiation Measurements
• XRF Safety Features
• Common sense Safety

Category by Handheld XRF

Oceanographic research helps in the planning, protection, and restoration of coastal wetlands. These landforms help protect us from storm surge flooding, control land erosion, improve water quality, and aid in the biodiversity of edible fish species. Tracking the movements of minerals and metals from extreme weather events, climate change effects, and harmful anthropogenic activities is a critical component of this research. Hence, elemental analysis is needed. Battery-operated portable X-ray fluorescence (XRF) is an especially helpful tool for field research because it provides fast, non-destructive elemental analysis measurements wherever and whenever they are needed. It can measure nutrient minerals, heavy metals, and other elements of interest in soil, sediment, vegetation, water, and biological life forms.

• Portable XRF for Coastal Wetlands Research
• Elemental Analysis for Coastal Research
• Fast Non-destructive Elemental Analysis
• Sediments Elemental Analysis
• Sample Preparation for Plant samples on portable XRF

Category by Handheld XRF

Bruker S1 TITAN to screen for Toxic Metals in the aluminum cookpots. 

• Heavy Element Screening
• Bruker S1 Titan 
• Toxic Elements in Cookware

Category by Handheld XRF

Jewelry containing lead can cause harm if it is put in the mouth, which is not an unusual thing for a child to do. If this toxic metal mixes with saliva or stomach acids, it can leach out into the body. Government regulations on the amount of lead (Pb) allowed in consumer products include the EU RoHS REACH limit of 500 PPM by weight in jewellery and the US EPA CPSIA limit of 100 PPM Pb by weight in children’s jewellery. Unfortunately, some children’s jewellery still contains this heavy metal at levels well above those restricted levels. Bruker provides two portable XRF analyzers for fast, straightforward, and nondestructive testing of jewellery for dangerous levels of lead. Learn how easy these portable analyzers are to use and how they can be taken directly to the samples for testing. Jewellery doesn’t need to be sent to a lab; it can be tested on assembly lines, at shipping/receiving areas, in jewellery and other specialty shops, or anywhere testing is needed.

• Consumer Safety Analysis
• In-situ Non-Destructive Analysis
• RoHS Compliance Analysis
• Restricted Material Analysis
• Pb, Hg, Cd, Total Cr

Category by Handheld XRF

Sulfur content in fuel is regulated because the exhaust from ship fuel, or bunker, is a significant contributor to harmful air pollution. The International Maritime Organization (IMO) enacted Marine Pollution (MARPOL) Annex VI, regulation 14, to ensure sea vessels comply with sulfur content in fuel restrictions to reduce exhaust pollution. There are multiple stakeholders for MARPOL Regulation 14, but vessel owners are ultimately responsible for compliance. IMO 2020 low sulfur in fuel regulations is enforced by local maritime authorities. There are two authorized EDXRF testing methods to determine compliance with the MARPOL sulfur regulations. Bruker offers two portable EDXRF analyzers which make the job faster and easier; and they can be taken wherever and whenever measurements are needed, including aboard ships. Learn about these complete portable EDXRF sulfur in fuel testing solutions from Bruker.

• Portable Handheld XRF
• MARPOL Sulfur Regulations
• ASTM D4294
• ISO 8754
• IMO 2020
• Marine Pollution Protection
• Sulfur in Oil Analysis
• Ready to go Factory MARPOL calibration
• Maritime Authorities
• Low Sulfur Regulations

Category by Handheld XRF

The Bruker Q4 TASMAN Series 2 spark optical emission spectrometer (s-OES) for metals analysis is ready and we would like to share its many enhancements with you! - Enhanced Analytical Performance: New element sets and extended ranges increase the analytical value. SmartSpark for enhanced speed and stability. - Enhanced Flexibility: MultiVision - the innovative dual optics concept fulfils individual analytical needs with reduced cost of ownership.
- Enhanced Usability: Next-generation software combines high functionality with ease of use. 
A wide range of metal applications including

• Iron and steel
• Aluminum
• Copper
• Other non-ferrous metals for the metals processing and foundry industry. 
• Lead
• Tin
• Zinc
• Nickel
• Cobalt, Titanium, Magnesium

Read more about the Q4 TASMAN Series 2 here: https://www.bruker.com/q4tasman Category by Spectrometer

The amount of carbon and sulphur in inorganic materials like iron, steel, cement, limestone, glass or ceramics is hard to measure. Combustion gas analysis makes the concentration measurement easy, fast and accurate. The use of UV absorption improves the accuracy of sulphur measurements significantly compared to IR absorption. Learn about the principles of C, S analysis by combustion with HF-induction and how its combination with ZoneProtect and HighSense detection advances the entire technique.

• Carbon & Sulfur in Inorganic Material Analysis
• By Combustion technique
• Iron & Steel
• Cement & Limestone
• Glass & Ceramics

Category by CS / ONH Analyzer

Light elements such as carbon, sulfur, nitrogen, oxygen and hydrogen play a crucial role in today's most advanced materials. Have you ever wondered how to do a fast and reliable analysis of these elements in solids?

• Bruker G4 Icarus
• Bruker G4 Phoenix
• Bruker G6 Leonardo
• Bruker G8 Galileo
• Carbon & Sulfur in Inorganic Material Analysis
• Oxygen, Nitrogen and Hydrogen in Advanced Material Analysis
• Combustion Analysis
• Fusion Analysis

Category by CS / ONH Analyzer

The Bruker Q2 ION is the smallest, lightest spark emission spectrometer (OES) available for metals analysis. It’s designed for small and medium-sized businesses in the metals industry, with a dedicated PMI workflow for incoming material testing and quality control, as well as standard analytical mode. Simple and easy to use. Versatile multi-matrix system. Affordable price and low running costs.

• Low running cost
• Fast and easy to use
• Easy maintenance
• In coming material testing 
• QA/QC of Ferrous and Non Ferrous
• Iron & Steel
• Copper
• Zinc
• Aluminium
• Tin 

Category by Spectrometer

The new PQ001 has many advantages such as small size, high precision, good repeatability, good stability and excellent cost/benefit performance. Based on these advantages, PQ001 has been widely used in the determination of oil & moisture content in agricultural areas.

Basic Parameters:

• Permanent magnet
• 12MHz Frequency
• Ø40mm Probe
• Oil range: 0.1%~100%
• Standard： ISO CD10565 & ISO CD10632

Principle of Oil/Moisture Content Testing
The hard pulse-echo sequence originating from the CPMG sequence with only one echo count, namely only one 180° pulse after the 90° pulse, shown in Figure, is applied to measure the oil and/or Moisture content in seed by means of NMR technology. After a 90° pulse, an FID signal appears and after a 180° pulse, an echo signal appears.

The total oil and moisture analysis using Niumag benchtop NMR for seeds and seeds residues has become the international standard method (ISO CD 10565 and ISO CD 10632),  In seeds, oil and water molecules all have hydrogen and they all contribute to NMR signals. In dried seeds, the water molecules are bound and the mobility of the water molecules is much more restricted than that of oil molecules which remain free in the seeds. Category by Spectrometer

PQ001 has many advantages such as small size, high precision, good repeatability, good stability and excellent cost/benefit performance.
PQ001 has been widely used in the determination of Solid Fat Content (SFC).
- Determination of solid fat content (SFC)
- Palm Oil SFC
- Palm Kernel
- Sunflower Oil & etc.

Basic Parameters:
Magnet: permanent magnet 0.5±0.08T
Probe:Ø10mm
Effective sample detection area:Ø10mm×H10mm;
Size (L, W, H): 1685mm×520mm×386mm
Weight: 134Kg

Features:
Test accuracy: 0.1% error for 5% oil content; 0.02% error for 0.5% oil content;
Repeatability: Relative standard deviation less than 2%;
Test limitation: 10mg oil or water;
Compliance with national standards: ISO8292 AOCS Cd 16b-93 Category by 未分类

Hirox Digital Microscope - HRX-01 Absolute High-Resolution Image

• Telecentric Ultra-High Resolution motorized zoom Lens
• All the new lenses are now fully motorized
• Intelligent magnetic adapters with RFID chips reduce human error, save time and make microscopy fun again!
• Completely new inclination stand featuring multiple integrated sensors with high precision 80 mm motorized Z axis.
• Multiple XY stages options: from 50x50mm up to 1000x1000mm for automatic XYZ acquisition, including extra large 3D stitching!
• The patented Hirox 3D Rotary-Head enables inspection from various angles with adjustable speed over 360°

                  

• Watch the video here --> https://www.hirox-usa.com/wp-content/uploads/2020/12/HRX-01-Full-HD-Rotary-Head.mp4 
• Image Analyzer
• Circuit Board (BGA)
• Material Testing
• Metallurgical
• Screen Pixels
• Textile | Fiber | Paper
• Biology Insect
• Art & Conservation Archaeology 
• Museum

Category by Microscopy

The full scan has been made with the Hirox 3D Digital Microscope at the Mauritshuis in the Hague (NL) with the support of Abbie Vandivere during the technical examination "Girl in the Spotlight".
More Information:

• www.hirox-europe.com
• www.hirox.com (Japanese/日本語)
• Girl in the spotlight project: www.mauritshuis.nl/en/girlinthespotlight
• Panorama: www.micro-pano.com/pearl
• 3D viewer: www.hirox-europe.com/PEARL/3D

Inspection: Emilien Leonhardt & Vincent Sabatier - Hirox Europe / JYFEL Corporation SARL
And thanks to Johannes Vermeer for this amazing Work of Art! Support the art and museums, and let's keep culture accessible to all! Category by Microscopy

HIROX IN MUSEUMS

The Hirox HRX-01 – 3D Digital Microscope – is a portable high-resolution inspection device with 3D measurement capabilities, allowing magnification from 0,1x up to 10.000x. 

This equipment enables 2D and 3D measurement including height and depth of material, pigments, cracks, and loss of material. 

The HRX-01 is also equipped with the new NPS (Nano Point Scanner), which is a non-contact confocal profilometer, allowing very accurate measurements including 3D surface and depth of transparent objects (suitable for varnish thickness measurements).

We recently developed a high-resolution microscope scanner: the custom-made stand with a motorized XYZ axis captured the largest microscopic panorama ever (over 10 billion pixels) from the Girl with a Pearl Earring from Johannes Vermeer, at the Mauritshuis (during the “girl in the spotlight” project with Abbie Vandivere).

Hirox is also part of the Technical Research Team of the TEFAF in Maastricht.

• High-Resolution Microscope
• 2D Measurements
• 3D Profiling
• 2D & 2D Stitching
• Over 10 billion pixels high-resolution microscope
• Full magnification from macro to micro

More Info: https://hirox-europe.com/applications/museum/ 
  Category by Microscopy

Hirox Digital Microscope

• 360-degree Rotary Head
• Zoom at 20, 40 and 80x zoom with the rotary head

Category by Microscopy

Flowers and flies were recorded with the Hirox 3D Digital Microscope RH-2000 using the patented Hirox Rotary Head.
Thanks to the National Museum of Natural History of Budapest (Hungary) and the Hungarian Forensic Police.
More information: www.hirox-europe.com Category by Microscopy

While the TRACER 5 has the ability to completely control the current and voltage, it also adds many new features which have been requested by our users. The user can select filters from the integrated filter wheel or insert user-designed filters. In addition, the measurements can be made in air, vacuum or helium atmosphere, which can be selected based on the needs of the user. The detector configuration and the small distance between the sample and detector make for a very sensitive system with some of the lowest detection limits available today. The TRACER 5 has approximately three times the sensitivity of the previous generation TRACERs, with helium purge TRACER 5 being the only handheld XRF that can elements as light as fluorine.

Features of the TRACER 5 family:

• 50kV-4W Rh target X-ray source
• Large area Graphene window SDD detector
• Selectable measurement spot size 3 mm or 8 mm
• Helium purge and optional portable vacuum pump
• 5-position automatic filter changer
• Manual filter / secondary target option
• Integrated processor and data storage
• Interactive touchscreen display
• Internal sample camera Wi-Fi and USB connectivity
• EasyCal software package for empirical user calibration
• Detects Fluorine 
• Element Range: Fluorine to Uranium

  

  Category by Handheld XRF

Join us as we talk to Dr. Molly Hanlon from Penn State about her use of the Bruker Tracer 5 Handheld XRF to support her research in deep root systems.

• Bruker Tracer
• Bruker S1 Titan
• How can XRF helps us understand more about plant roots
• Why study Roots

Category by Handheld XRF

Rigaku's NEX QC SERIES of benchtop EDXRF (energy dispersive X-ray fluorescence) analyzers offers low cost analysis of solids, liquids, powders, alloys and thin films. Specifically designed for routine elemental analysis applications, the NEX QC analyzer is ideally suited for industrial at-line quality control applications. For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ delivers superior calibrations and precision for the most challenging measurements.

Features

• Analyze Na to U non-destructively
• Solids, liquids, alloys, powders and thin films
• 50 kV X-ray tube for wide elemental coverage
• Semiconductor detector for superior data quality
• Modern smartphone style "icon driven" user interface
• Multiple automated tube filters for enhanced sensitivity
• Convenient built in thermal printer
• Low cost with unmatched performance-to-price ratio

APPLICATION NOTES

The following application notes are relevant to this product

---

ACZA wood treatment
Analysis of copper in ore
Analysis of S, Ni, V and Fe in residual oil
Ash content in coal
CCA wood treatment
Chlorine (Cl) and sulfur (S) in cement
Chromium conversion coating on aluminum
CuO wood treatment
Gold alloys
IPBC wood treatment
Iron (Fe) in aluminum (Al) metal
Iron (Fe) in ore materials
Iron in hay as a raw material for cattle feed
Iron oxide in silica sand
Lead (Pb) in gasoline per ASTM D5059
Lubricating oil by ASTM D6481
Manganese in Gasoline
Marine Fuel Analyzer
PENTA wood treatment
Phosphorus on fabric
Plating Baths
Silicone coating on paper and plastic
Silver (Ag) in barite ore
Sulfur (S) in gypsum
Sulfur in bunker fuel by ASTM D4294
Sulfur in coal
Sulfur in crude oil by ASTM D4294
Sulfur in diesel by ASTM D4294
Ti and Fe in kaolin clay
Ti conversion coating on aluminum (Al)
Zirconium on Aluminum Category by Benchtop EDXRF

Rigaku offers a state-of–the-art solution for your elemental analysis needs, with the NEX DE energy dispersive X-ray fluorescence spectrometer. The Rigaku NEX DE spectrometer delivers rapid quantitative determination of major and minor atomic elements, from sodium through uranium, in the widest possible variety of sample types — with or without standards.
 

XRF elemental analysis in the field, plant or lab

Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high performance choice for routine elemental analysis by XRF.

Features

• Analyze Na to U non-destructively
• Powerful QuantEZ Windows^®-based software
• Solids, liquids, alloys, powders and thin films
• 60 kV X-ray tube for wide elemental coverage
• FAST SDD^® detector for superior counting statistics
• Multiple automated tube filters for enhanced sensitivity
• Unmatched performance-to-price ratio
• Optional RPF-SQX fundamental parameters software
• Optional standardless fundamental parameters software

APPLICATION NOTES

The following application notes are relevant to this product

---

Additive Elements in Lubricating Oils - ASTM D7751
Air Filter Detection Limits
Analysis of Alloy Powders for Metal 3D Printing
Analysis of Carbon Black
Analysis of S, Ca, V, Fe, Ni in crude oil
Electrowinning gold processing
Finished Portland Cement
Gold & uranium in used ore material from ore dumps and tailing piles
Heavy metals in aerosols on air filters
Material Identification
Ni:Fe Metallurgy
Nuclear Power Station Cooling Water Filters
Organic Chlorides in Crude by ASTM D4929 Part C
Palladium Catalyst in Pharmaceuticals
Silver (Ag) and copper (Cu) in copper ore
Sulfur in ULSD by ISO13032

  Category by Benchtop EDXRF

Rigaku NEX CG II is a powerful second-generation benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer for non-destructive elemental analysis of sodium to uranium in almost any matrix. The Rigaku NEX CG II pushes the boundaries of EDXRF technology with its unique close-coupled Cartesian Geometry (CG) optical kernel. NEX CG II serves a broad range of applications and industries and is an ideal tool for measuring ultra-low and trace element concentrations into percentage levels.
 

CARTESIAN GEOMETRY AND POLARIZATION FOR TRACE LEVEL SENSITIVITY

NEX CG II builds on NEX CG’s legacy of using Cartesian Geometry and secondary targets for trace-level sensitivity. NEX CG II features a unique and improved close-coupled Cartesian Geometry optical kernel that dramatically increases the signal-to-noise ratio and delivers enhanced elemental analysis.

Unlike conventional EDXRF spectrometers, NEX CG II is an indirect excitation system using secondary targets rather than tube filters. Monochromatic and polarized excitation from secondary targets vastly improves detection limits for elements in highly scattering matrices like water, hydrocarbons, and biological materials. Secondary target excitation in full 90° Cartesian Geometry eliminates background noise. As a result, NEX CG II brings a new level of analytical sensitivity to XRF technology. Users can measure ultra-low and trace element concentrations, even in challenging sample types.

NEX CG II achieves this superior analytical power with a 50 kV 50 W end-window palladium-anode X-ray tube, five secondary targets covering the complete elemental range sodium through uranium (Na – U), and a high-throughput large-area silicon drift detector (SDD). This unique optical kernel, combined with Rigaku’s advanced RPF-SQX Fundamental Parameters software, delivers the most sensitive EDXRF measurements in the industry.

EASY INSTRUMENT CONTROL WITH ADVANCED QUALITATIVE AND QUANTITATIVE ANALYTICAL SOFTWARE

NEX CG II is easy to use with QuantEZ®, a powerful PC-based software providing intuitive instrument control with simple menu navigation and a customizable EZ Analysis interface. Users can maximize their time and productivity with simplified routine operations and create their own methods using a simple flow bar wizard.

Advanced qualitative and quantitative analysis is powered by Rigaku’s RPF-SQX Fundamental Parameters (FP) software, featuring Rigaku Profile Fitting (RPF) technology and Scattering FP. This robust integrated software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards. Rigaku’s Scattering FP method automatically estimates the concentration of unmeasurable low atomic number elements (H to F) and provides appropriate corrections. 

Calibration standards can be expensive and difficult to obtain for many applications. With RPF-SQX, the number of required standards is greatly reduced, significantly lowering the cost of ownership and reducing workload requirements for running routine analyses.

Features

• Non-destructive elemental analysis for sodium (Na) to uranium (U)
• Quick elemental analyses of solids, liquids, powders, coatings, and thin films
• Indirect excitation for exceptionally low detection limits
• High-power 50 kV 50 W X-ray tube
• Large-area high-throughput silicon drift detector (SDD)
• Analysis in air, helium, or vacuum
• Powerful and easy-to-use QuantEZ^® software with a multilingual user interface
• Advanced RPF-SQX Fundamentals Parameters software featuring Scattering FP
• Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
• Various automatic sample changers accommodating up to 52 mm samples
• Low cost of ownership

APPLICATION NOTES

Analysis of Cement and ASTM C114 Qualification
Analysis of ULSD
EPA Tier 3 Gasoline
Mn in Gasoline by ASTM D5059 Part D
Organic Chlorides in Crude by ASTM D4929 Part C
Pb in Gasoline by ASTM D5059 Part C & A
Additive Elements in Lubricating Oils per ASTM D7751
Agricultural Soils & Plant Materials
Alloy Powders for 3D Printing
Analysis of Air Filters - U.S. EPA Sensitivity
Analysis of Animal Feeds
Analysis of Coal by the FP Method
Analysis of Coal Fly Ash
Analysis of Fiberglass
Analysis of Gemstones
Analysis of Glass & Raw Materials
Analysis of heavy metals in aerosols on air filters
Analysis of Lead / Zinc Ore
  Category by Benchtop EDXRF

Rigaku NEX DE VS - Benchtop EDXRF
A high-performance small (variable) spot benchtop EDXRF elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with an easy-to-learn Windows®-based QuantEZ software. Small spot analysis, from sodium (Na) through uranium (U), of almost any matrix - from solids, thin films and alloys to powders, liquids and slurries.
 

XRF elemental analysis in the field, plant or lab

Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease of use of the NEX DE adds to its broad appeal for an ever-expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high-performance choice for routine elemental analysis by XRF.
 

XRF with 60 kV X-ray tube and SDD detector

The 60 kV X-ray tube and Peltier-cooled FAST SDD^® Silicon Drift Detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

XRF options: autosampler, vacuum, helium and standardless FP

Options include fundamental parameters, a variety of automatic sample changers, a sample spinner and a helium purge or vacuum atmosphere for enhanced light element sensitivity. *FAST SDD^® is a registered trademark of Amptek, Inc.

Features

• Analyze Na to U non-destructively
• 1, 3 and 10 mm spot sizes, software selectable
• High-resolution imaging for accurate sample positioning
• Powerful QuantEZ Windows^®-based software
• Solids, liquids, alloys, powders and thin films
• 60 kV X-ray tube for wide elemental coverage
• FAST SDD^® detector for superior counting statistics
• Multiple automated tube filters for enhanced sensitivity
• Unmatched performance-to-price ratio
• Optional RPF-SQX fundamental parameters software
• Optional standardless fundamental parameters software

APPLICATION NOTES

The following application notes are relevant to this product

---

Air Filter Detection Limits
Analysis of Alloy Powders for Metal 3D Printing
Electroless Nickel plating
Industrial Forensics
Lead in lead-free solder
Material Identification
Ni:Fe Metallurgy
Palladium Catalyst in Pharmaceuticals
RoHS: Cr, Hg, Pb, Br and Cd in polyethylene
  Category by Benchtop EDXRF

Rigaku NEX LS Scanning Coating Analyzer

Designed explicitly to meet the needs of challenging conditions found in coating and converting processes, NEX LS helps maintain routine quality control for web and coil applications. The NEX LS linear scanner provides real-time coat weight profiling of your process. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, conversion coatings, fuel cell loadings, metalized plastic, top coatings on the metal coil, and fire retardants on fabric.
 

Featuring advanced third-generation energy dispersive X-ray fluorescence (EDXRF) technology, NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications.

• In-line, real-time coat weight profiling
• Measure elements aluminium (AI) to uranium (U)
• Robust Rigaku NEX Series optical kernel
• Industrial touchscreen user interface

Energy Dispersive X-ray Fluorescence (EDXRF)

To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With their proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminium (Al) through uranium (U).

Coating Thickness and Composition

Rigaku NEX LS is specifically designed to service web and coil applications, with the ability to perform multi-element composition, coat weight or coating thickness. The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Where needed, the elemental composition of a coating is measured directly. In contrast, coat weight (or coating thickness) may be measured directly (where the counting rate for an element is proportional to thickness) or indirectly by measuring the attenuation of some substrate element (where the counting rate is negatively correlated to thickness).

Silicone Release Coatings

Benchtop EDXRF spectrometers have long been a familiar technology for release coatings, converters, vacuum-formed plastics manufacturers and other industries using silicone oils as barrier layers, release coatings or denesting agents. Real-time scanning, for tighter process control tolerances, takes EDXRF technology for silicone coatings analysis to the next level. Silicone coatings are applied to plastic and paper substrates to modify the release characteristics of a product (like labels) or packaging. If too little silicone is applied or if there are areas of the web where the silicone coating is missing, the adhesive release properties will be adversely affected in release applications or the denesting characteristics of the vacuum-formed plastic will be compromised causing product rejection or disruption in manufacturing and other downstream processes. If too much silicone is applied, the cost of the manufactured roll increases, reducing profitability and in some cases impacting the acceptance and performance of the end product.

Category by Benchtop EDXRF

Rigaku NEX OL

Featuring advanced 3rd generation energy dispersive X-ray fluorescence (EDXRF) technology, NEX OL represents the next evolution of process elemental analysis for liquid stream applications. Designed to span from heavy industrial through to food-grade process gauging solutions, the NEX OL is configurable for use in both classified and non-classified areas.

• Real-time process control by elemental analysis
• Measure elements of aluminium to uranium
• From ppm levels to weight percent (wt%)
• Robust NEX QC+ optics with SDD detector
• Industrial touchscreen user interface
• Easy empirical calibration and routine operation
• Toolless routine maintenance
• Multiple remote analysis heads (non-classified)
• No dangerous radioisotopes

Rigaku NEX XT - High Level Sulfur Measurement

NEX XT is the next generation process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums.

• Measure sulfur (S) from 200 ppm to 6 wt%
• Compact design with no routine maintenance
• Up to 1450 psig and 200°C
• User-adjustable data update frequency
• Reduced standards requirements
• No sample condition or recovery system
• No radioisotopes

Category by Benchtop EDXRF

Product Description
EDUMR is a desktop NMR device designed for MRI experimental teaching. Courses to teach NMR principles and experiments through MRI demonstration can be created by including EDUMR in physical corresponding majors (modern physics, applied physics, radio physics, electronic engineering, etc.) or medical corresponding majors (large-scale medical apparatus, medical imaging technology, biomedical engineering, etc.). Extensive experimental courses and majors like NMR engineering related to hardware structure can also be established through the use of EDUMR.
MRI Education System NMR principle and magnetic resonance imaging theory EDUMR20-015V-I | Niumag Corporation (nmranalyzer.com) 

Basic Parameters:
Magnet type: permanent magnet
Magnetic field intensity: 0.5±0.08T
Probe coil: Ø15mm
Weight: 138Kg

Applications:
1. NMR analyzing and imaging mechanism
Basic NMR analyzing and imaging mechanism
NMR phenomenon
Relaxation and NMR signal
Spatial orientation of NMR signal
NMR image reconstruction
Pulse sequence

2. MRI system
Magnet body system
RF(radio frequency) system
Gradient field system
Spectrometer and computer system
Magnetic shielding and RF shielding
Pulse sequence

3.NMR&MRI Principium experiments
Mechanical and electronic shimming
Lamor frequency measurement by hard pulse FID sequence
FID sequence signal in the rotating coordination system
1D-processing and gain adjustment of FID signal
Hard pulse RF measurement with hard pulse-echo sequence
Soft pulse RF measurement with soft pulse FID sequence
Soft pulse-echo sequence
T1 relaxation time measurement using inversion restoring method
T1 relaxation time measurement using saturation restoring method
T2 relaxation time measurement using hard pulse CPMG sequence
Chemical shift measurement of alcohol

Category by Spectrometer